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Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere

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Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

discrete and continuous control

The test methods

Management Functions exchange command

for the case of simple models of the human body

ensuring the effectiveness and operability of visual testing equipment for the product inspection process

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Who is BS 6101-2 - Accuracy of ball screws for

Acoustically-actuated systems

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Draught strip materials specifically designed for use on the bottom of doors are also excluded from BS 7386

information and signalling” has been revised and replaced by a new class 22 “Assistive products for communication and information”

The guiding corrosion values specify the technical content of each of the individual corrosivity categories for these standard metals

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