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Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere
Description
Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
discrete and continuous control
The test methods
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